Blog TENTANG NI Launches Pxie6356 and USB6356 for Improved Data Acquisition

Engineers and researchers facing complex signal integration and data acquisition challenges now have powerful new tools at their disposal. The NI PXIe-6356 and USB-6356 represent the pinnacle of high-performance measurement technology, offering unprecedented signal processing capabilities and system integration efficiency.

The Art of Connectivity: Precision Engineering in PXIe-6356 and USB-6356

Every connection point in these systems reflects meticulous design consideration. From screw terminals to BNC interfaces and PXIe modules, each pin definition and signal routing pathway has been carefully engineered to maximize signal integrity and usability.

USB-6356: Versatile Connection Options

• Comprehensive pinout diagrams for both screw terminal and BNC configurations
• Clear signal mapping for analog I/O (AI/AO), digital ground (D GND), and programmable function interfaces (PFI)
• Precision timing control through counter/timer signals (CTR 0-3) with default PFI terminal mapping
• +5V power output for system integration flexibility

PXIe-6356: Modular System Advantages

• High-density PXI Express module design for maximum integration
• Optimized for complex PXIe chassis environments with multiple modules
• Exceptional bandwidth and low-latency performance for demanding applications

Analog Signal Mastery: Uncompromising Accuracy

Both devices demonstrate exceptional performance in analog signal processing, with rigorous attention to measurement accuracy throughout the signal chain.

Analog Input Specifications

• 8 differential channels with 16-bit ADC resolution
• 1.25 MS/s single-channel sampling rate for capturing fast transient signals
• ±10 V input range with excellent common-mode rejection ratio (CMRR)
• Comprehensive accuracy specifications including gain error, offset temperature coefficient, and random noise

Advanced Triggering Capabilities

• Flexible analog triggering supporting AI channels and APFI 0 as sources
• Multiple trigger modes including edge and window detection
• High-bandwidth triggering (3.4 MHz for AI, 3.9 MHz for APFI 0)

Analog Output Performance

• 2-channel 16-bit DAC with 3.3 MS/s update rate
• ±10 V output range with 0.4 Ω output impedance
• ±5 mA output current drive capability
• Detailed absolute accuracy specifications for predictable performance

Digital Signal Processing: Flexible I/O and Precision Timing

The systems extend beyond analog measurement with robust digital I/O and counter/timer functionality.

Digital I/O Features

• 24 configurable digital I/O channels (8 Port 0 + 16 PFI/Port 1/Port 2)
• Programmable filter settings for noise rejection
• High-speed sampling clocks (10 MHz PXIe/1 MHz USB)
• PFI channels supporting multiple functions including timing I/O

Counter/Timer Capabilities

• 4× 32-bit counters supporting multiple measurement modes
• 100 MHz internal timebase with external clock support
• Flexible input routing for complex timing applications
• Pulse generation, frequency division, and other output functions

System Integration and Reliability

Designed for demanding environments, both platforms deliver exceptional system integration and operational reliability.

Bus Interface Options

• PXIe version: x1 module compatible with x1/x4 slots, 8 DMA channels
• USB version: USB 2.0 Hi-Speed with 8-channel data streaming

Power and Environmental Specifications

• Detailed power requirements and current limits for safe operation
• Comprehensive environmental ratings for temperature, humidity, and storage
• Compliance with international safety standards including IEC 61010-1 and EN 61326-1
• RoHS compliance for environmental responsibility

The NI PXIe-6356 and USB-6356 represent a significant advancement in test and measurement technology, combining precision signal processing with flexible system integration capabilities. Whether implementing complex signal analysis, high-accuracy data acquisition, or building integrated test systems, these platforms deliver the performance and reliability required for today's demanding measurement challenges.