ブログ について National Instruments Launches Highdensity Precision SMU for Device Testing

In the rapidly evolving electronics industry, testing precision, speed, and flexibility have become critical factors determining product competitiveness. The PXIe-4141, a new 4-channel precision source measurement unit (SMU) from National Instruments, addresses these challenges with breakthrough performance capabilities.

The PXIe-4141 features advanced 4-quadrant operation, enabling precise sourcing and measurement of both voltage and current across positive and negative ranges. Each channel incorporates independent 4-wire remote sensing functionality, effectively compensating for lead voltage drops in complex test environments to deliver uncompromised measurement accuracy.

With its high sampling rate, the instrument significantly reduces measurement time while capturing transient characteristics like switching behavior or capacitor charge/discharge cycles. This capability proves essential for dynamic performance evaluation and rapid I-V characterization in semiconductor and consumer electronics applications.

The PXIe-4141's digital trigger and synchronization engine enables precise coordination with other SMUs and PXI instruments, creating powerful multi-channel test matrices. This synchronization capability allows seamless integration with switch matrices and high-speed digital test modules, making the solution ideal for complex, high-pin-count device testing scenarios.

The instrument's proprietary SourceAdapt technology addresses a key challenge in precision measurement by allowing output response optimization based on device load characteristics. By adjusting damping coefficients, the technology minimizes transient oscillations while ensuring signal stability and rapid convergence.

• Multi-channel capability: Four independent precision SMU channels
• 4-quadrant operation: Supports positive/negative voltage and current sourcing/measurement
• High accuracy: Integrated 4-wire remote sensing ensures measurement integrity
• Current sensitivity: Down to 10 pA for precision low-current measurements
• Voltage range: ±10 V for broad application coverage
• DC current range: ±100 mA for mainstream testing requirements
• Power capacity: 1 W maximum sourcing/sinking capability

The PXIe-4141 comes with multiple service plan options, including a 3-year Premium Service Program and Hardware Standard Service. These programs streamline system setup and maintenance while maximizing uptime and compliance with industry standards.

• Semiconductor parameter testing and characterization
• Consumer electronics R&D and production testing
• Automotive electronics reliability validation
• Aerospace and defense component qualification
• Energy system performance evaluation

By combining multi-channel precision, rapid response, and intelligent synchronization with innovative SourceAdapt technology, the PXIe-4141 establishes new benchmarks for high-density device testing. The solution delivers measurable improvements in both testing efficiency and measurement accuracy across multiple industries.