블로그 약 National Instruments Launches 1ghz Pxie5820 VST for Advanced Signal Testing

In the rapidly evolving field of electronic communications, the complexity of signals and precision requirements for testing continue to escalate, particularly in cutting-edge technological developments such as wireless communications, radar systems, and aerospace applications. The demand for test instruments capable of delivering wide bandwidth, high-precision signal generation and analysis, coupled with flexible programmability, has become crucial for driving technological innovation.

National Instruments' PXIe-5820 Vector Signal Transceiver (VST) represents a comprehensive solution integrating multiple advanced technologies. With its exceptional 1GHz bandwidth, powerful FPGA processing capabilities, and rapid tuning speed, this instrument opens new possibilities for complex signal testing and verification.

As a standout product in NI's PXI Express series, the PXIe-5820 combines a high-performance I/Q digitizer and arbitrary waveform generator in a compact 2-slot PXIe module. This integrated approach enables engineers to complete the entire workflow from signal generation to reception analysis on a single platform, significantly simplifying test system construction and improving operational efficiency.

The instrument's 1GHz frequency bandwidth covers current and future mainstream communication bands, addressing the needs of high-bandwidth applications such as 5G NR and Wi-Fi 6E. More importantly, it supports complex I/Q modulated signals, enabling precise simulation and analysis of various advanced modulation schemes to meet stringent requirements for signal authenticity and accuracy in research and development.

The PXIe-5820 distinguishes itself through the integration of several key technologies. Its built-in broadband I/Q digitizer features excellent sampling rates and resolution for capturing high-speed, detailed signal characteristics. Simultaneously, the broadband I/Q arbitrary waveform generator can produce highly flexible and diverse test signals, creating realistic operating environments for devices under test (DUT).

These capabilities are coordinated through a high-performance, user-programmable FPGA module. This FPGA integration provides the PXIe-5820 with robust real-time signal processing capabilities, allowing users to develop customized signal processing algorithms for specific applications. This enables advanced functions such as real-time RF signal demodulation and dynamic interference signal generation, which are particularly valuable for research scenarios requiring rapid iteration and customized testing.

The PXIe-5820 excels in several critical performance areas that determine testing efficiency. Its built-in signal generator achieves a typical tuning time of just 0.38 milliseconds, enabling rapid switching between target frequencies during multi-frequency or multi-signal sequence testing. This fast response capability substantially reduces overall test cycles, offering significant value for applications requiring large-scale production testing or complex scenario simulations.

Memory configuration serves as another important indicator of a high-performance signal transceiver's capability to handle large datasets. The PXIe-5820 is equipped with substantial DRAM and SRAM resources. Its onboard DRAM is divided into two independent banks, each offering 2GB capacity with a theoretical maximum data transfer rate of 12GB/s. This provides a solid foundation for processing massive datasets at high sampling rates. Additionally, the 2MB SRAM offers high-speed local storage for the FPGA, with maximum read and write speeds of 31MB/s and 29MB/s respectively, supporting efficient real-time data processing and algorithm execution.

For signal input/output, the PXIe-5820 provides flexible configuration options. It supports both DC and AC (through per-terminal coupling) input coupling methods, accommodating different signal source types. The input interface employs differential mode, enhancing noise immunity and enabling more precise signal measurements. The instrument features two input channels, further strengthening its multi-channel signal processing and analysis capabilities. The differential input impedance is typically 100±10 ohms, a critical parameter for ensuring effective signal transmission and minimizing signal reflection.

As a PXIe module, the PXIe-5820 measures 1.6 x 5.1 x 8.5 inches and weighs just 1.8 pounds (approximately 0.82 kg). This compact and lightweight design facilitates easy integration into PXIe chassis, enabling the construction of highly modular and flexible test and measurement systems. The space-efficient form factor allows engineers to implement powerful testing capabilities within limited physical spaces.