E4727B Keysight Noise Analyzer Low Frequency With 1A Current Capability

Name: E4727B Keysight Noise Analyzer Low Frequency With 1A Current Capability
Brand: Shenzhen Jinxi Boyuan Technology Co., Ltd.
SKU: E4727B
Price: 10 USD
Availability: InStock

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E4727B Keysight Noise Analyzer Low Frequency With 1A Current Capability

Large Image : E4727B Keysight Noise Analyzer Low Frequency With 1A Current Capability

Product Details:

Place of Origin:	China
Brand Name:	Keysight
Model Number:	E4727B

Payment & Shipping Terms:

Minimum Order Quantity:	one
Price:	$10,000
Packaging Details:	standard packaging
Delivery Time:	Delivery time for minimum order quantity ≤ 30 days
Payment Terms:	T/T ‌L/C
Supply Ability:	100 units/day

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E4727B Keysight Noise Analyzer Low Frequency With 1A Current Capability

Description

Brand:	Keysight	Model:	E4727B
Equipment Modeling Application:	Low Frequency Noise Measurement	Maximum Frequency:	100 MHz
Measurement Function::	Flicker Noise Random Telegraph Noise
Highlight:	E4727B Keysight Noise Analyzer , Low Frequency Keysight Noise Analyzer , E4727B Low Frequency Noise Analyzer

Keysight E4727B Advanced Low Frequency Noise Analyzer

The E4727B Advanced Low Frequency Noise Analyzer provides deeper insights into low frequency noise when integrated with WaferPro Express, offering comprehensive data analysis, wafer prober control, and test suite automation capabilities.

Key Features

Integrated with PathWave WaferPro (WaferPro Express) for turnkey noise measurements including DC characteristics, capacitance, and RF S-parameters
Newly designed LNA enables measurement of extremely low device noise, including transistor linear region noise
Capable of noise measurements at very low bias currents
High-power device noise measurement capability (up to 1A)
Fast measurement speeds with multiple averaging for improved efficiency at high accuracy
Comprehensive software module for DC characteristics, 1/f noise, and random telegraph noise measurement and analysis

Detailed Capabilities

Feature	Description / Capability
Software Integration	Seamless integration with PathWave WaferPro (WaferPro Express) software enables turnkey solutions for noise, DC characteristics, capacitance, and RF S-parameter measurements.
Measurement Sensitivity	Newly designed LNA enables extremely low device noise measurement, such as transistor linear region noise and measurements at very low bias currents.
High-Power Capability	Capable of high-power device noise measurement under high current conditions (e.g., up to 1A).
Measurement Speed	Fast measurement speed improves productivity, even under high-accuracy conditions requiring extensive averaging.
Software Analysis Module	Dedicated software module measures DC characteristics, 1/f noise, and random telegraph noise (RTN), and performs data analysis.

Keysight E4727B Advanced Low Frequency Noise Analyzer

Measurement interface of the E4727B Analyzer

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Contact Person: ALEXLEE

Tel: +86 15626514602

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